Phelos angular spectrometer launched!
/Fluxim is proud to unveil Phelos. Phelos measures the emitted spectrum of OLEDs for angles up to 85° in a completely automated way.
Read MoreFluxim is proud to unveil Phelos. Phelos measures the emitted spectrum of OLEDs for angles up to 85° in a completely automated way.
Read MoreThe new Paios version is here. Checkout Paios 4.0.
Graphical redesign, easier data handling, more postprocessing, sweep lists, ...
The new Paios flyer is available now for download with information about new modules and up-coming features.
Read MoreWe are happy to announce the release of a new Paios version: Paios 3.3
It contains various improvements for our existing customers, like the new technique called OTRACE for CELIV measurements.
We ask you to spare 10 minutes of your time to fill-out the Fluxim User Survey. As a dedicated R&D tool provider for the OLED and thin film PV industry, making Fluxim tools answer to the demands of your R&D work is essential. Fluxim is constantly looking to improve the Setfos and Laoss simulation tools and the Paios measurement platform.
Read MoreFluxim is pleased to announce the release of a new software tool: Laoss. Laoss is a simulation software for design and optimization of large-area electrodes in OLEDs and solar cells.
Read MoreToday we officially release Setfos 4.4. Several new features are introduced for light scattering, mode analysis and electrical modelling.
Read MoreWe have just released the a new software-version for the measurement system Paios. It extends the Paios measurement system with new functionalities like the charge extraction experiment, IMPS, IMVS and low frequency impedance down to 10 mHz.
Read MoreA new software-version for the measurement platform Paios has just been released. Customers profit from new features for data analysis and measurement.
Also new software and hardware modules are now available.
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Fluxim is proud to announce that Setfos version 4.3 is officially released. Setfos 4.3 contains some nice new features:
Customers will receive an e-mail with the download link to Setfos 4.3. In case you did not receive it please contact support@fluxim.com.
Read MoreThe next version of Setfos 4.2 has been released! Setfos 4.2 introduces: Microtexture scattering based on topography data Shockley Read Hall recombination Transient Luminance analysis
Read MoreA new version 4.1 of the OLED & (O)PV design tool Setfos has been released in December 2014. With version 4.1 both surface and volume scattering can be studied by the introduction of Mie scattering.
With Setfos 4.1 the impedance of multilayer devices can be calculated and photogeneration of charges at interfaces of multilayer OPV devices is now included.
FLUXiM is a provider of device simulation software and characterization platforms to the display, lighting, photovoltaics and electronics industries worldwide.