Fluxim provides tools for research and development of OLEDs for the display and lighting market. Our customers in industry and academia use our simulation and measurement tools to understand device physics and optimize OLED structure and materials.

Optimize OLED Light Emission

Setfos Emission is a simulation software that calculates optical interference in thin-film layers. It considers optical interference and guided modes and can calculate light emission from OLEDs. Thereby, colour, angular distribution, efficiacy (and more!) can be studied and optimized.

Use Setfos Advanced Optics to optimize layer stacks with scattering structures. With this module you can improve the device efficiency by adding scattering elements, such as quantum dots, scattering particles, scattering surfaces and birefringent materials.

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Modeling Charge Transport in OLEDs

Setfos simulates charge transport in OLED with the Drift-Diffusion module. It allows fine-tuning of the device layer stack and thicknesses, together with a deep understanding of the underlying physical processes governing the device operation.

Simulation of the current-voltage (IV) characteristics, transient signals and results obtained by impedance spectroscopy (small signal analysis) is possible with Setfos. In combination with our measurement systems Paios and Phelos, the simulation software gets even more powerful by fitting automatically the experimental results.

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Electroluminescence and Photoluminescence versus Angle

Phelos is a characterization tool to measure the electroluminescence (EL) of OLEDs and other devices over a range of emission and polarization angles. Moreover, the photoluminescence (PL) signal of a given light-emitting material can be collected on a broad range. PL and EL can be measured by a compact table-top instrument with both s-polarized and p-polarized light.

In combination with Setfos the emission-zone of an OLED can be calculated. This means that you can determine where in your emission layer the dipoles are emitting, and which is the orientation of the dipoles.

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Opto-Electrical Characterization of OLEDs

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The characterization system Paios performs a variety of electrical and optical measurements on OLEDs with one click. All measurements are performed automatically, leading to highly systematic results.

Paios is suitable to determine the charge carrier mobility, trap density and distribution, recombination, injection barriers, doping-densities, series resistance, capacitance and other working parameters of an OLED.

  • IVL-curves, transient eletroluminescence (TEL).

  • Charge extraction by linearly increasing voltage (CELIV)-

  • impedance spectroscopy, capacitance-voltage.

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Simulate the Upscaling of OLEDs

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Going from a millimeter-scale OLED to a large scale for displays or lighting is a big challenge. Because of ohmic losses, lateral current flow leads to a voltage drop at the electrodes which results, for example, in non-uniformity of the light-emitting device.

Use the simulation software laoss to simulate large area OLEDs and optimize metal grids to enhance conductivity. Modeling both electrical and electro-thermal effects in OLEDs with our software. Use also the powerful 3D ray-tracing algorithm in laoss to couple the OLED with complex optical elements or surface structuring.

Learn more about Laoss