Paios Features
The combination of opto-electrical measurements in steady-state, frequency and time domain provides deeper insight into the device physics. The experimental capabilities listed below are provided through Fluxim’s Characterization Suite (CS) software—operational across Paios, Phelos, and Litos platforms—enabling advanced measurement control, data analysis, and parameter extraction.
Main Characteristics
Parameter Sweeps
Sweeping means that the experiment is performed several times by changing one or two measurement parameters. Characterization Suite allows to graphically check the measurement data easily with a sweep slider.
Data Acquisition and Comparison
Paios is more than a measurement tool. It acquires systematic data of dozens of devices and lets you compare them in its management software. Learn from your experiments without tedious manual processing of data.
User-Defined Signals for Custom-made Experiments
Design your own transient experiments using the Custom Signal Editor.
A new idea for an experiment can easily be tested.
Correction of RC-Effects
RC-effects are superimposed on the device current and can significantly disturb transient experiments. Paios provides routines to extract the series resistance and the geometric capacitance of the device.
Flexible Time-Resolution
Traditional measurement setups using linear time sampling can resolve only 3 orders of magnitude in time. Paios performs measurements that can resolve 7 orders of magnitude in time, in one shot.
This feature is especially useful for perovskite solar cells. Perovskite based devices exhibit an extraordinarily broad dynamic range from microseconds to minutes. These time dynamics can be resolved with the Flex-Res feature of Paios.
Perovskite: Device Preconditioning
The response of perovskite solar cells and LEDs depends on the spatial ion distribution inside the device prior to the measurement. This leads to hysteresis in the IV curve. Paios can precondition the device with voltage, current, and/or illumination and perform the experiments immediately afterwards. This increases the experiment reproducibility and helps to better understand mobile ions.
Use preconditioning to investigate the effect of mobile ions, or deep trap states.
In our blog “WHY PEROVSKITE SOLAR CELLS WITH HIGH-EFFICIENCY SHOW SMALL IV-CURVE HYSTERESIS” we describe how to study hysteresis effects in perovskite solar cells with a combined experimental and simulation method.
Postprocessing (via CS Software)
Paios comes with flexible and user-friendly post-processing routines. This enables to easily analyze experiments and extract parameters even for novice users.
Basic (O)LED parameters from IVL:
Extract IVL parameters at a fixed current to compare them between multiple devices.
Basic Solar Cell Parameters from IV:
Extract short-circuit current, open-circuit voltage, maximum power and fill factor of a solar cell.
One-/Two-Diode model:
A common method to fit the IV curve and obtain global device parameters like the ideality factor.
Turn-on voltage of (O)LEDs:
Automatically obtain the onset voltage of the emission from the IVL curve.
Equivalent Circuit Fitting:
Impedance spectroscopy data is often analyzed by equivalent circuits. In CS many different as well as user-defined circuits can be fitted to the measurement data.
Kramers-Kronig Impedance Test:
Check the consistency of the impedance spectrum.
Characteristic frequency/time from Impedance:
Find peaks in different representations of the impedance spectroscopy data and store their characteristic time.
RC from Impedance:
A reliable method to determine the series resistance, parallel resistance, and geometric capacitance of a device.
RC from Voltage Pulse:
A small voltage pulse in reverse allows to determine the capacitance and series resistance.
RC from dark-CELIV:
This method allows to independently obtain the geometric capacitance and series resistance.
Mobility from CELIV:
Extracts the charge carrier mobility using the dark-, photo-, MIS- or injection-CELIV experiment.
Mobility from Transient Electroluminescence:
Extract the mobility from the delay time between applying voltage and EL turn-on of an OLED.
Mobility from Mott-Gurney fit:
In unipolar devices the charge carrier mobility can be extracted from the IV curve using an SCLC fit.
Recombination from OTRACE-CELIV:
Analyze the recombination dynamics from OTRACE-CELIV with varied delay time.
Recombination from OTRACE-Charge Extraction:
Analyze the recombination dynamics from OTRACE-Charge Extraction with varied delay time.
Recombination Lifetime from IMVS:
Easily determine the characteristic time in IMVS which corresponds to the recombination lifetime.
Recombination lifetime from TPV Decay:
Determine the recombination lifetime by fitting the TPV decay with a mono- or biexponential law.
Charge/Doping density from Photo-/Dark-CELIV:
The CELIV overshoot is integrated to obtain the photogenerated charge or intrinsic doping density.
Doping density from Capacitance-Voltage:
Employing a Mott-Schottky analysis, the doping density can be determined.
Transport time from IMPS:
Easily determine the characteristic time in IMPS that describes how fast charges are collected.
Characteristic Time from TPC Rise:
Determine characteristic times of charge collection by fitting the TPC rise with a single or double exponential.
Characteristic Time from TPC Decay:
Determine characteristic times of charge collection by fitting the TPC decay with a single or double exponential.
Phosphorescence Lifetime from Transient EL Decay:
Extract the luminescence lifetime of OLEDs from the Transient EL decay.
Examples - Characterization Suite
Wizard to Add New Experiments
User Defined Signals
Temperature Dependent CELIV Measurement
Measurement in Progress
Defining Device Parameters
CELIV Postprocessing to Extract Charge Carrier Density
Compare Device Parameters
CELIV Experiment Definition
Stress-Test Definition
Equivalent Circuit Fitting for Impedance Measurements
Determine Solar Cell Parameters
Device Parameter Overview
IV-Curves with Varied Light Intensity
Key Results
Hardware Manager Live Control
T R I A L E V A L U A T I O N
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