Overview

Phelos is an angular luminescence spectrometer to characterize light emitting devices and thin films over varied emission and polarization angles. While traditional goniometric instruments focus on either electroluminescence (EL) or photoluminescence (PL), Phelos incorporates both measuring techniques in one table-top compact instrument. The Phelos software can be easily coupled to the powerful simulation software Setfos for data analysis, parameter extraction, and device modeling.

Trusted by industry and academia, Phelos measurements have substantially contributed to numerous scientific publications

angular luminescence spectrometer to characterize light emitting devices and thin films over varied emission and polarization angles

Advantages

Angular photoluminescence (PL) spectroscopy on organic, quantum-dot and perovskite light-emitting thin films.
Angular electroluminescence (EL) spectroscopy on OLEDs and other light-emitting devices.
Angle dependence of the light emission of an OLED and other light-emitting devices.
Compatible with top and bottom emitting OLED structures.
Detection of p- and s-polarized signal, or continuous sweep over polarization angles.
Determine where in your emission layer the dipoles are emitting, and which is the orientation of the dipoles.
Integrated data analysis allows to determine dipole orientation with one click.
Easily coupled to Setfos for advanced parameter extraction and device modeling.
Flexible contacting of any sample geometry and easy sample alignment.
Acquire current-voltage-luminance (IVL) curves with the integrated SMU
Measure: EQE, lm/W, Cd/A, CRI and CIE coordinates
Polarizers and macro-extraction lens included. Multiple light sources are available.

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Different Operation Modes

Phelos is a spectrometer for both Photoluminescence and Electroluminescence measurements. The instrument is equipped with an internal SMU that is used alternatively for the EL or PL characterization.

Electroluminescence

Down-Conversion and Scattering

Photoluminescence

measurement system for the analysis of the electroluminescence of an organic light-emitting diode and a perovskite light-emitting diode

characterization of down conversion in quantum dots

Analysis of the Color Efficiency.
Viewing Angle.
(EQE, lm/W, Cd/A) .
Fitting of the Emission Zone.
Emitter Orientation.

Angular Dependent Analyis of the light emission characteristics.
Emitter orientation.
Spectrum and Color per Emission Angle.
Polarization in Light-Emitting Thin Films.

Characterization of the Scattering and Down-Conversion in Thin Films
OLEDs functionalized with Quantum Dots

Post-processing of Experiemental Data:

Working point
Efficacy (cd/A)
CIE coordinates
Color temperature, CRI …

Spectral Irradiance/Intensity
Radiance/Radiant Intensity
Luminous Intensity

analysis of the CIE coordinates of a display

The software provided with Phelos is an all-in-one platform to characterize your sample and analyze your data. The Graphical User Interface (GUI) allows you to extract easily the orientation of the dipoles in your light-emitting film with an automated fitting routine.

the graphical user interface of the software controlling phelos. The automated fitting procedure helps to extract the orientation of the dipole in the light-emitting layer

Specifications

    Photoluminescence and Electroluminescence
  
    Angular Range
    -90° to +90°, top and bottom emission
  
    Optical Resolution
    < 0.5°
  
    Spectral Range
    360 to 880 nm or 360 to 1100 nm 
  
    Spectral Resolution
    1.2 nm
  
    Voltage Range 
    ± 20 V  
  
    Current Range
    
± 120 mA  
  
    Minimal Resolvable Current
    < 100 pA
  
    Motorized Polarizer 
    0 to   360° (continuous) 
  
    Sample stage size
    40 x 40 mm2 
  
    PL Excitation
    18 mW, 275 nm to 405 nm* 
  
    Computer Connection
    USB
  
    Weight
    18 kg
  
    Dimensions
    52 x 29 x 24 cm3
  
    PL Illumination Spot Size
    5 x 3 mm2   
  
    *Default wavelength is 365 nm. Various excitation wavelengths optionally available