Phelos is an angular luminescence spectrometer to characterize light emitting devices and thin films over varied emission and polarization angles. While traditional goniometric instruments focus on either electroluminescence (EL) or photoluminescence (PL), phelos incorporates both measuring techniques in one table-top compact instrument. The Phelos sotware can be easily coupled to the powerful simulation software Setfos for data analysis, parameter extraction and device modeling.
Photoluminescence (PL) of organic, quantum-dots and perovskite light-emitting thin films over varied emission and polarization angles.
Electroluminescence (EL) of OLEDs and other light-emitting devices on both s- and p-polarization.
Easily coupled to Setfos for accurate parameter extraction and device modeling.
Determine where in your emission layer the dipoles are emitting, and which is the orientation of the dipoles.
Flexible contacting of any sample geometry and easy sample alignment.
Acquire current-voltage-luminance (IVL) curves with the integrated SMU
Measure: EQE, lm/W, Cd/A, CRI and CIE coordinates
Polarizers and macro-extraction lens included. Multiple light sources available.
|Angular range||-85° to +85°|
|Optical resolution||< 1°|
|Spectral range||360 to 880 nm|
|Spectral resolution||1.2 nm|
|Voltage range||± 20 V|
|Current range||± 120 mA|
|Minimal resolvable current||< 100 pA|
|Motorized polarizer||0 to 360° (continuous)|
|Sample stage size||40 x 40 mm2|
Different excitation wavelengths optionally available
|18 mW, 275 nm|
|PL illumionation spot size||5 x 3 mm2|
|Dimensions||52 x 29 x 24 cm3|