Fluxim is proud to unveil Phelos. Phelos measures the emitted spectrum of OLEDs for angles up to 85° in a completely automated way.Read More
We are happy to announce the release of a new Paios version: Paios 3.3
It contains various improvements for our existing customers, like the new technique called OTRACE for CELIV measurements.
We ask you to spare 10 minutes of your time to fill-out the Fluxim User Survey. As a dedicated R&D tool provider for the OLED and thin film PV industry, making Fluxim tools answer to the demands of your R&D work is essential. Fluxim is constantly looking to improve the Setfos and Laoss simulation tools and the Paios measurement platform.
Fluxim is pleased to announce the release of a new software tool: Laoss. Laoss is a simulation software for design and optimization of large-area electrodes in OLEDs and solar cells. To start an evaluation get in touch with Fluxim, check out the flyer or read the press release.
Some key features of Laoss are:
- IV curve in a few clicks
Laoss evaluates solar cell metrics such as the open-circuit voltage, the short-circuit current, the maximum generated power and the fill factor.
- OLED panel optimization
Minimize ohmic losses & optical shadowing and improve the layout of the electrodes and metal grids in order to obtainuniform and bright OLED panels.
- Solar cell optimization
Laoss allows to find the optimal shape of finger electrodes (width and spacing) to minimize the optical shadowing and ohmic losses. Laoss can also be used to determinate the best material choice (transparency, conductivity & thickness) in order to obtain solar cells with higher fill factor.
- Full module simulation
Solar cell modules consist of several cells connected in series. With Laoss you can estimate the best number of sub-cells in order to minimize inactive areas from interconnections and loss of fill factor due to large single cell sizes.
- Intuitive workflow
Thanks to its intuitive graphical user interface, Laoss is an easy-to-use software.
Laoss can interface to standard CAD layout tools via DXF files or you can sweep parametrized basic geometries. IV curves can be imported from experiments or analytical models.
We have just released the a new software-version for the measurement system Paios. It extends the Paios measurement system with new functionalities like the charge extraction experiment, IMPS, IMVS and low frequency impedance down to 10 mHz.Read More
A new software-version for the measurement platform Paios has just been released. Customers profit from new features for data analysis and measurement.
Also new software and hardware modules are now available.
Fluxim is proud to announce that Setfos version 4.3 is officially released. Setfos 4.3 contains some nice new features:
- Ray tracing can now be used for BSDF calculations. In this was light scattering of mirco-lenses and other high aspect ratio light management structures can be simulated.
- 64-bit version and 70% calculation speed increase.
- Implicit Drift Diffusion solver: Transient simulations with a larger timestep without loss of accuracy. In some cases the computation time is reduced from 15 minutes to 1 minute.
- Visualization of imported profile data and design options for micro-lenses & pyramids.
Customers will receive an e-mail with the download link to Setfos 4.3. In case you did not receive it please contact email@example.com.Read More
A new version 4.1 of the OLED & (O)PV design tool Setfos has been released in December 2014. With version 4.1 both surface and volume scattering can be studied by the introduction of Mie scattering.
With Setfos 4.1 the impedance of multilayer devices can be calculated and photogeneration of charges at interfaces of multilayer OPV devices is now included.