Phelos is an angular luminescence spectrometer to characterize both OLED and other light emitting devices as well as luminescence of thin films. While traditional goniometric instruments focus on either electroluminescence (EL) or photoluminescence (PL) measurements, Phelos incorporates both techniques in one instrument and links to the powerful simulation software Setfos for parameter extraction.

  • OLED efficiency
  • Viewing angle
  • Emitter orientation and position
  • One click operation


  • Characterize single films or working devices
    electroluminescence EL or photoluminescence PL
  • Measure s- and p-polarized light
  • Easily couple measurement by Phelos with simulation by Setfos
  • Determine emitter molecule orientation and position within the device



  • The Phelos probe tips allow flexible contacting of any sample geometry.
  • Acquire current-voltage-luminance (IVL) curves with the integrated SMU
  • Measure: EQE, lm/W, Cd/A, CRI and CIE coordinates
  • Polarizers and macro-extraction lens included

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Angular range -85° to +85°
Optical resolution < 1°
Spectral range 360 to 880 nm
Spectral resolution 1.2 nm
Voltage range ± 20 V
Current range ± 120 mA
Minimal resolvable current < 100 pA
Motorized polarizer 0 to 360° (continuous)
Sample stage size 40 x 40 mm2
PL excitation
Different excitation wavelengths optionally available
18 mW, 275 nm
PL illumionation spot size 5 x 3 mm2
Computer Connection USB
Weight 18 kg
Dimensions 52 x 29 x 24 cm3

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The Phelos flyer contains all relevant information about Phelos and its features:

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