Research Blogs
Quantification of trap states by thermally stimulated current in thin film solar cells
The performance of light-emitting (LEDs) and photovoltaic (PV) devices depends on the quality of the photoactive semiconductor material. The unintentional introduction of defects in the semiconductor material due to material impurities or during the fabrication process causes the deviation from optimal performance.
These defects are referred to as trap states, or in short “traps”, which are energetic states within the bandgap of a semiconductor. In general, traps can occur due to material impurities (in the bulk) or at the interfaces between layers of different materials.
In the following blog post, we will present how to characterize the trap states with the technique called thermally stimulated current (TSC). We also propose a method to reliably interpret the TSC results based on drift-diffusion simulations.
How to quantify Non-radiative voltage losses and recombination in solar cells
The open-circuit voltage (Voc) is the electrical potential difference between the two terminals of a solar cell, when there is no external load applied, hence no electric current flows. Correspondingly, this means that, when a voltage equivalent to the Voc is applied to the terminals of the solar cell, the recombination current (Jrec, which typically follows a non-ideal diode equation) and the photocurrent (Jph, the current generated by illuminating the solar cell) are equal, hence the net current is zero (Jrec=Jph at V= Voc).
Solar cells often present also non-radiative recombination mechanisms, in addition to the radiative one, as a result of poor material quality and non-idealities. To increase the Voc and thus potentially the power conversion efficiency, it is necessary to minimize the ΔVoc,nrad. It is, therefore, necessary to quantify the total loss and determine its origin.
Electroluminescence (EL) and photoluminescence quantum yield (PLQY) allow to directly extract the ΔVoc,nrad for thin-film solar cells such as perovskite solar cells, kesterite, perovskite, organic, or quantum dot. solar cells.
After quantifying the losses, the combination of capacitance-voltage (CV), temperature-dependent voltage characteristics (JV-T), and capacitance-frequency (Cf-T) measurements are essential to identify the recombination mechanisms.