Research Paper: Impact of Layer Materials, Their Thicknesses, and Their Reflectivities on Emission Color and NVIS Compatibility in OLED Devices for Avionic Display Applications

Scientific Summary

This study investigated the impact of OLED layer materials and thicknesses (HIL, HTL, ETL) on emission color, luminance, and efficiency, primarily to achieve MIL-STD-3009 Night Vision Imaging Systems (NVIS) compatibility for avionic displays. Key findings revealed the Electron Transport Layer (ETL) is critical for color tuning, with its material and thickness significantly shifting color coordinates and influencing NVIS compliance. Optimal ETL thickness (51 nm for 3TPYMB) was shown to minimize cathode reflectivity to 92%, boosting luminance to 3470 cd/m² and current efficiency to 34.73 cd/A, confirming NVIS Green B compatibility. This work provides crucial insights for designing high-efficiency, color-accurate military OLED displays by highlighting the ETL's dominant role in meeting stringent NVIS standards.

Publication Details

Uçar, E., Ülkü, A., Kaya, H.M., Serin, R.B., Kaçar, R., Oral, A.Y. and Menşur, E. (2025), Impact of Layer Materials, Their Thicknesses, and Their Reflectivities on Emission Color and NVIS Compatibility in OLED Devices for Avionic Display Applications. Micromachines, 16, 191. https://doi.org/10.3390/mi16020191.

Fluxim Tools Used

Setfos was the primary simulation tool for the optical and electrical analysis of organic material structures. It was used to model the OLED device, select optimal materials for electron-hole balance in each layer, and calculate device efficiency. Specifically, SETFOS conducted 35 extensive simulations, varying HIL, HTL, and ETL materials and thicknesses to determine their impact on color coordinates, luminous efficiency, and NVIS compatibility. The ability of SETFOS to comprehensively analyze complex organic device architectures was instrumental in identifying critical parameters and optimizing layer configurations for desired performance.