Identify spatial inhomogeneities in solar cells with confidence
PL, EL, lock-in thermography and electrical characterisation in one compact platform.
Vitios combines photoluminescence (PL), electroluminescence (EL), infrared imaging and electrical characterisation (JV, impedance) with software for seamless measurement customisation and embedded post-processing. It enables spatially resolved analysis of solar cells beyond standard electrical measurements.
Spatially resolve inhomogeneities not visible in JV measurements
Combine PL, EL, DLIT, ILIT and SS-DLIT with electrical characterisation
Perform 4-wire JV and impedance spectroscopy measurements
Analyse recombination, charge extraction and dissipative losses
Apply transient and steady-state imaging for perovskite devices
Beyond JV measurements
Solar cell scale-up, stressing experiments and new deposition methods directly impact device performance as estimated by JV measurements. However, electrical measurements do not provide spatially resolved information.
Vitios enables imaging-based analysis to locate and identify spatial inhomogeneities in films and full devices.
Vitios is ideal if you:
Publish or plan to publish solar cell imaging or characterisation data
Work on perovskite, thin-film, or tandem solar cells
Need to identify spatial inhomogeneities, defects, or recombination hotspots
Want to correlate imaging results with JV and impedance measurements
Study ion-driven transients, degradation, or scale-up challenges
Get spatially resolved insight before your next publication
Combine PL, EL, lock-in thermography and electrical characterisation in one compact platform. Talk to an imaging expert to see if Vitios fits your research.
Moon Kang Heo
Dr. Lu Zhang
Dr. Markus Regnat